A study of Some Electrical Properties of Te:S Thin Films Deposited at Angle Ó¨=70o
In this research a study of some electrical properties Of (Te) thin films with(S) impurities of(1.2%) were deposited at( Ó¨=700)by thermal evaporation technique .The thicknesses of deposited films were (1050 , 1225 , 1400 , 1575 nm) on a glass substrates of different dimensions . From X-ra...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
University of Baghdad
2017-04-01
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| Series: | Ibn Al-Haitham Journal for Pure and Applied Sciences |
| Subjects: | |
| Online Access: | https://jih.uobaghdad.edu.iq/index.php/j/article/view/369 |