Ellipsometry data analysis and ellipsometric spectra of complex materials
Optical and structural properties of materials can be characterized by spectroscopic ellipsometry which represents an experimental technique that measures polarized light reflected from a material surface. Since the most complicated part of this method is data analysis and modeling, we present the c...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Savez inženjera i tehničara Srbije
2014-01-01
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| Series: | Tehnika |
| Subjects: | |
| Online Access: | http://scindeks-clanci.ceon.rs/data/pdf/0040-2176/2014/0040-21761402185S.pdf |