Statistical and Fractal Description of Defects on Topography Surfaces
In this article, simulated/artificial surfaces consisting of perfectly ordered and mounded (perfect) structures and defective surfaces are characterised through statistical and fractal methods. The image sizes are designed to mimic atomic force microscopy (AFM) of scan area 1 μm2 and maximum height...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2023-01-01
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| Series: | MATEC Web of Conferences |
| Online Access: | https://www.matec-conferences.org/articles/matecconf/pdf/2023/01/matecconf_icarae2023_01001.pdf |