Expected resolution limits of x-ray free-electron laser single-particle imaging for realistic source and detector properties

Expected resolution limits of x-ray free-electron laser single-particle imaging for realistic source and detector properties

The unprecedented intensity of x-ray free-electron laser sources has enabled single-particle x-ray diffraction imaging (SPI) of various biological specimens in both two-dimensional projection and three dimensions (3D). The potential of studying protein dynamics in their native conditions, without cr...

Full description

Bibliographic Details
Main Authors: Juncheng E, Y. Kim, J. Bielecki, M. Sikorski, R. de Wijn, C. Fortmann-Grote, J. Sztuk-Dambietz, J. C. P. Koliyadu, R. Letrun, H. J. Kirkwood, T. Sato, R. Bean, A. P. Mancuso, C. Kim
Format: Article
Language:English
Published: AIP Publishing LLC and ACA 2022-11-01
Series:Structural Dynamics
Online Access:http://dx.doi.org/10.1063/4.0000169

Internet

http://dx.doi.org/10.1063/4.0000169

Similar Items