Fastest Thickness Measurements with a Terahertz Time-Domain System Based on Electronically Controlled Optical Sampling

Fastest Thickness Measurements with a Terahertz Time-Domain System Based on Electronically Controlled Optical Sampling

We apply a fast terahertz time-domain spectroscopy (TDS) system based on electronically controlled optical sampling (ECOPS) to contact-free thickness gauging. Our setup achieves a measurement speed of 1600 terahertz pulse traces per second, which—to our knowledge—represents the f...

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Bibliographic Details
Main Authors: Milad Yahyapour, Angelika Jahn, Katja Dutzi, Thomas Puppe, Patrick Leisching, Bernhard Schmauss, Nico Vieweg, Anselm Deninger
Format: Article
Language:English
Published: MDPI AG 2019-03-01
Series:Applied Sciences
Subjects:
terahertz time-domain instrumentation
thickness gauging
ECOPS
real-time inspection
non-destructive testing
Online Access:https://www.mdpi.com/2076-3417/9/7/1283

Internet

https://www.mdpi.com/2076-3417/9/7/1283

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