Influence of non‐ideal line‐reflect‐match calibration standards on vector network analyzer S‐parameter measurements
Abstract In this paper, an improved two‐step method is presented for the sensitivity analysis of vector network analyzer (VNA) S‐parameter measurements due to the non‐ideal line‐reflect‐match (LRM) calibration standards. This improved method is based on the indirect uncertainty propagation mechanism...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2023-08-01
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| Series: | IET Science, Measurement & Technology |
| Subjects: | |
| Online Access: | https://doi.org/10.1049/smt2.12150 |