Influence of non‐ideal line‐reflect‐match calibration standards on vector network analyzer S‐parameter measurements
Abstract In this paper, an improved two‐step method is presented for the sensitivity analysis of vector network analyzer (VNA) S‐parameter measurements due to the non‐ideal line‐reflect‐match (LRM) calibration standards. This improved method is based on the indirect uncertainty propagation mechanism...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2023-08-01
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| Series: | IET Science, Measurement & Technology |
| Subjects: | |
| Online Access: | https://doi.org/10.1049/smt2.12150 |
| Summary: | Abstract In this paper, an improved two‐step method is presented for the sensitivity analysis of vector network analyzer (VNA) S‐parameter measurements due to the non‐ideal line‐reflect‐match (LRM) calibration standards. This improved method is based on the indirect uncertainty propagation mechanism, which is especially suitable for the S‐parameter measurements applying the self‐calibration technique. To further simplify the formula derivation, the deviation matrices [δA] and [δB] are newly defined to represent the uncertainties of the T‐matrices of error boxes. With this definition, formulas for the deviations of device under test (DUT) S‐parameters can be concluded as functions of [δA] and [δB] in a concise form. Eventually, by solving only three linear combinations of the elements from [δA] and [δB], the sensitivity coefficients of DUT S‐parameters due to non‐ideal LRM can be conveniently deduced in an analytical form. Finally, experiments are performed to verify the proposed method. |
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| ISSN: | 1751-8822 1751-8830 |