Dissecting the Genetic Basis of Yield Traits and Validation of a Novel Quantitative Trait Locus for Grain Width and Weight in Rice

Dissecting the Genetic Basis of Yield Traits and Validation of a Novel Quantitative Trait Locus for Grain Width and Weight in Rice

Grain yield in rice is a complex trait and it is controlled by a number of quantitative trait loci (QTL). To dissect the genetic basis of rice yield, QTL analysis for nine yield traits was performed using an F<sub>2</sub> population containing 190 plants, which was developed from a cross...

Full description

Bibliographic Details
Main Authors: Man Yin, Xiaohong Tong, Jinyu Yang, Yichen Cheng, Panpan Zhou, Guan Li, Yifeng Wang, Jiezheng Ying
Format: Article
Language:English
Published: MDPI AG 2024-03-01
Series:Plants
Subjects:
rice
yield trait
grain width
grain weight
quantitative trait locus
Online Access:https://www.mdpi.com/2223-7747/13/6/770

Internet

https://www.mdpi.com/2223-7747/13/6/770

Similar Items