Online dynamic flat-field correction for MHz microscopy data at European XFEL

Online dynamic flat-field correction for MHz microscopy data at European XFEL

The high pulse intensity and repetition rate of the European X-ray Free-Electron Laser (EuXFEL) provide superior temporal resolution compared with other X-ray sources. In combination with MHz X-ray microscopy techniques, it offers a unique opportunity to achieve superior contrast and spatial resolut...

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Bibliographic Details
Main Authors: Sarlota Birnsteinova, Danilo E. Ferreira de Lima, Egor Sobolev, Henry J. Kirkwood, Valerio Bellucci, Richard J. Bean, Chan Kim, Jayanath C. P. Koliyadu, Tokushi Sato, Fabio Dall'Antonia, Eleni Myrto Asimakopoulou, Zisheng Yao, Khachiwan Buakor, Yuhe Zhang, Alke Meents, Henry N. Chapman, Adrian P. Mancuso, Pablo Villanueva-Perez, Patrik Vagovič
Format: Article
Language:English
Published: International Union of Crystallography 2023-11-01
Series:Journal of Synchrotron Radiation
Subjects:
mhz x-ray microscopy
flat-field correction
online data processing
x-ray free-electron laser
Online Access:http://scripts.iucr.org/cgi-bin/paper?S1600577523007336

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http://scripts.iucr.org/cgi-bin/paper?S1600577523007336

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