Modal Reconstruction Based on Arbitrary High-Order Zernike Polynomials for Deflectometry

Deflectometry is a non-destructive, full-field phase measuring method, which is usually used for inspecting optical specimens with special characteristics, such as highly reflective or specular surfaces, as well as free-form surfaces. One of the important steps in the Deflectometry method is to retr...

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Bibliographic Details
Main Authors: Duy-Thai Nguyen, Kim Cuc Thi Nguyen, Binh X. Cao, Van-Thuc Tran, Tiendung Vu, Ngoc-Tam Bui
Format: Article
Language:English
Published: MDPI AG 2023-09-01
Series:Mathematics
Subjects:
Online Access:https://www.mdpi.com/2227-7390/11/18/3915