Modal Reconstruction Based on Arbitrary High-Order Zernike Polynomials for Deflectometry
Deflectometry is a non-destructive, full-field phase measuring method, which is usually used for inspecting optical specimens with special characteristics, such as highly reflective or specular surfaces, as well as free-form surfaces. One of the important steps in the Deflectometry method is to retr...
Main Authors: | , , , , , |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2023-09-01
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Series: | Mathematics |
Subjects: | |
Online Access: | https://www.mdpi.com/2227-7390/11/18/3915 |