Examination of Polymer Blends by AFM Phase Images
Atomic force microscopy (AFM) belongs to the high-resolution surface morphology investigation methods. Since it can, in many cases, be applied in air, samples can more easily be inspected than by a scanning electron microscope (SEM). In addition, several special modes exist which enable examination...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2023-04-01
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| Series: | Technologies |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2227-7080/11/2/56 |