Examination of Polymer Blends by AFM Phase Images
Atomic force microscopy (AFM) belongs to the high-resolution surface morphology investigation methods. Since it can, in many cases, be applied in air, samples can more easily be inspected than by a scanning electron microscope (SEM). In addition, several special modes exist which enable examination...
Main Authors: | Enrico Werner, Uwe Güth, Bennet Brockhagen, Christoph Döpke, Andrea Ehrmann |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2023-04-01
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Series: | Technologies |
Subjects: | |
Online Access: | https://www.mdpi.com/2227-7080/11/2/56 |
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