Development and Characterization of a Novel Wheat–Tetraploid <i>Thinopyrum elongatum</i> 6E (6D) Disomic Substitution Line with Stripe Rust Resistance at the Adult Stage

Development and Characterization of a Novel Wheat–Tetraploid <i>Thinopyrum elongatum</i> 6E (6D) Disomic Substitution Line with Stripe Rust Resistance at the Adult Stage

Stripe rust, which is caused by <i>Puccinia striiformis</i> f. sp. <i>tritici</i>, is one of the most devastating foliar diseases of common wheat worldwide. Breeding new wheat varieties with durable resistance is the most effective way of controlling the disease. Tetraploid &...

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Bibliographic Details
Main Authors: Biran Gong, Lei Zhao, Chunyan Zeng, Wei Zhu, Lili Xu, Dandan Wu, Yiran Cheng, Yi Wang, Jian Zeng, Xing Fan, Lina Sha, Haiqin Zhang, Guoyue Chen, Yonghong Zhou, Houyang Kang
Format: Article
Language:English
Published: MDPI AG 2023-06-01
Series:Plants
Subjects:
chromosomal substitution
molecular markers
stripe rust
tetraploid <i>Thinopyrum elongatum</i>
Online Access:https://www.mdpi.com/2223-7747/12/12/2311

Internet

https://www.mdpi.com/2223-7747/12/12/2311

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