Multivariate Process Control Chart Pattern Classification Using Multi-Channel Deep Convolutional Neural Networks

Statistical process control (SPC) charts are commonly used to monitor quality characteristics in manufacturing processes. When monitoring two or more related quality characteristics simultaneously, multivariate <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" displ...

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Bibliographic Details
Main Authors: Chuen-Sheng Cheng, Pei-Wen Chen, Yu-Chin Hsieh, Yu-Tang Wu
Format: Article
Language:English
Published: MDPI AG 2023-07-01
Series:Mathematics
Subjects:
Online Access:https://www.mdpi.com/2227-7390/11/15/3291