A Secure JTAG Wrapper for SoC Testing and Debugging

A Secure JTAG Wrapper for SoC Testing and Debugging

IEEE Std. 1149.1, also known as the Joint Test Access Group (JTAG) standard, provides excellent controllability and observability for ICs and hence is widely used in IC testing, debugging, failure analysis, or even online chip control/monitoring. Unfortunately, it has also become a backdoor for atta...

Full description

Bibliographic Details
Main Authors: Kuen-Jong Lee, Zheng-Yao Lu, Shih-Chun Yeh
Format: Article
Language:English
Published: IEEE 2022-01-01
Series:IEEE Access
Subjects:
Hardware security
IEEE test standard security
JTAG security
memory attack
secure JTAG wrapper
physical unclonable function (PUF)
Online Access:https://ieeexplore.ieee.org/document/9749066/

Internet

https://ieeexplore.ieee.org/document/9749066/

Similar Items