A Secure JTAG Wrapper for SoC Testing and Debugging
IEEE Std. 1149.1, also known as the Joint Test Access Group (JTAG) standard, provides excellent controllability and observability for ICs and hence is widely used in IC testing, debugging, failure analysis, or even online chip control/monitoring. Unfortunately, it has also become a backdoor for atta...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2022-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9749066/ |