Automatic Prediction of Metal–Oxide–Semiconductor Field‐Effect Transistor Threshold Voltage Using Machine Learning Algorithm

Automatic Prediction of Metal–Oxide–Semiconductor Field‐Effect Transistor Threshold Voltage Using Machine Learning Algorithm

A fast and precise threshold voltage (Vth) extraction method is required for the process design of electronic systems using metal–oxide–semiconductor field‐effect transistors (MOSFETs) and its immediate on‐site analysis during fabrication. The selection of a suitable Vth extraction method is a compl...

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Bibliographic Details
Main Authors: Seoyeon Choi, Dong Geun Park, Min Jung Kim, Seain Bang, Jungchun Kim, Seunghee Jin, Ki Seok Huh, Donghyun Kim, Jerome Mitard, Cheol E. Han, Jae Woo Lee
Format: Article
Language:English
Published: Wiley 2023-01-01
Series:Advanced Intelligent Systems
Subjects:
decision tree
k -nearest neighbors
machine learning
MOSFET
threshold-voltage extraction
Online Access:https://doi.org/10.1002/aisy.202200302

Internet

https://doi.org/10.1002/aisy.202200302

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