Automatic Prediction of Metal–Oxide–Semiconductor Field‐Effect Transistor Threshold Voltage Using Machine Learning Algorithm
A fast and precise threshold voltage (Vth) extraction method is required for the process design of electronic systems using metal–oxide–semiconductor field‐effect transistors (MOSFETs) and its immediate on‐site analysis during fabrication. The selection of a suitable Vth extraction method is a compl...
Main Authors: | Seoyeon Choi, Dong Geun Park, Min Jung Kim, Seain Bang, Jungchun Kim, Seunghee Jin, Ki Seok Huh, Donghyun Kim, Jerome Mitard, Cheol E. Han, Jae Woo Lee |
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Format: | Article |
Language: | English |
Published: |
Wiley
2023-01-01
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Series: | Advanced Intelligent Systems |
Subjects: | |
Online Access: | https://doi.org/10.1002/aisy.202200302 |
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