A Lightweight Detector Based on Attention Mechanism for Fabric Defect Detection

A Lightweight Detector Based on Attention Mechanism for Fabric Defect Detection

Defects on fabric surfaces are difficult to identify owing to unsuitable computing devices, highly complex algorithms, small size, and high degree of integration with the fabric. To this end, this study proposes a lightweight fabric defect-detection network, YOLO-SCD, based on attention mechanism. T...

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Bibliographic Details
Main Authors: Xin Luo, Qing Ni, Ran Tao, Youqun Shi
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Access
Subjects:
Fabric defect detection
SoftPool
attention mechanism
depthwise separable convolution
lightweight
Online Access:https://ieeexplore.ieee.org/document/10091552/

Internet

https://ieeexplore.ieee.org/document/10091552/

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