A Lightweight Detector Based on Attention Mechanism for Fabric Defect Detection
Defects on fabric surfaces are difficult to identify owing to unsuitable computing devices, highly complex algorithms, small size, and high degree of integration with the fabric. To this end, this study proposes a lightweight fabric defect-detection network, YOLO-SCD, based on attention mechanism. T...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2023-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10091552/ |