Guest Editorial: Machine learning applied to quality and security in software systems

Bibliographic Details
Main Authors: Honghao Gao, Walayat Hussain, Ramón J. Durán Barroso, Junaid Arshad, Yuyu Yin
Format: Article
Language:English
Published: Hindawi-IET 2023-08-01
Series:IET Software
Online Access:https://doi.org/10.1049/sfw2.12141