Critical-point models to relate yield and disease intensity of the multiple pathosystem in rice leaf spots disease

Critical-point models to relate yield and disease intensity of the multiple pathosystem in rice leaf spots disease

ABSTRACT: The occurrence of leaf spots in irrigated rice can reduce the yield and compromise the quality of the grain. However it is unknown the economic damage threshold (EDT) that these spots cause the yield of crop. The objective of this study was to obtain damage functions for models of critical...

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Bibliographic Details
Main Authors: Luiz Carlos Bordin, Ricardo Trezi Casa, Leandro Luiz Marcuzzo, Erlei Melo Reis, André Gheller, Rômulo Luís Zancan, Maiquiel Diego Fingstag
Format: Article
Language:English
Published: Universidade Federal de Santa Maria 2016-01-01
Series:Ciência Rural
Subjects:
Oryza sativa
Pyricularia oryzae
Bipolaris oryzae
Gerlachia oryzae
dano
Online Access:http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0103-84782016000100007&lng=en&tlng=en

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http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0103-84782016000100007&lng=en&tlng=en

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