Study on Temperature and Etching Effects on Silicon Oxide Formation Using Laser Ellipsometric Method

In this paper, a laser ellipsometric method is implemented to study theformation of oxide films on silicon substrate at room temperature in air. Twolasers, He-Ne and semiconductor diode, as well as a tungsten halogen lamp,were used as a light source in this method to show the importance ofcoherency...

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Bibliographic Details
Main Authors: Z. Khalid, . Al-Baldawi AmmarM, H. Ammar
Format: Article
Language:English
Published: Unviversity of Technology- Iraq 2007-06-01
Series:Engineering and Technology Journal
Subjects:
Online Access:https://etj.uotechnology.edu.iq/article_181294_2a018befcb392dd80c07feb3756e6d4a.pdf