First-sharp diffraction peaks in amorphous GeTe and Ge2Sb2Te5 films prepared by vacuum-thermal deposition
We report on a presence of intermediate-range order in amorphous GeTe and Ge2Sb2Te5 phase change films prepared by simple vacuum-thermal deposition. We find that thermally deposited GeTe and Ge2Sb2Te5 films show significant first sharp diffraction peaks (FSDPs) in the X-ray diffraction pattern, alth...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2012-12-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4773329 |