A Mixture between Rule 90 and Rule 150 Cellular Automata as a Test Pattern Generator
Built-in Self-test (BIST) is one of integrated circuit (IC) testing techniques that can be used as a pseudo-random generator for the Circuit Under Test (CUT). This paper introduces the design and simulation of a 4-bit test pattern generator (TPG) using a one dimension Linear Hybrid Cellular Automata...
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| Format: | Artykuł |
| Język: | English |
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Unviversity of Technology- Iraq
2018-09-01
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| Seria: | Engineering and Technology Journal |
| Hasła przedmiotowe: | |
| Dostęp online: | https://etj.uotechnology.edu.iq/article_175278_c19717367def7a77e3b18462e46a3996.pdf |