Stress redistribution in individual ultrathin strained silicon nanowires: a high-resolution polarized Raman study

Strain nano-engineering provides valuable opportunities to create high-performance nanodevices by a precise tailoring of semiconductor band structure. Achieving these enhanced capabilities has sparked a surge of interest in controlling strain on the nanoscale. In this work, the stress behavior in ul...

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Bibliographic Details
Main Authors: Alvarado Tarun, Norihiko Hayazawa, Maria Vanessa Balois, Satoshi Kawata, Manfred Reiche, Oussama Moutanabbir
Format: Article
Language:English
Published: IOP Publishing 2013-01-01
Series:New Journal of Physics
Online Access:https://doi.org/10.1088/1367-2630/15/5/053042