X-ray diffraction with micrometre spatial resolution for highly absorbing samples

X-ray diffraction with micrometre spatial resolution for highly absorbing samples

X-ray diffraction with high spatial resolution is commonly used to characterize (poly)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing samples or the simultaneous assessment of high-Z materia...

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Detalhes bibliográficos
Main Authors: Prerana Chakrabarti, Anna Wildeis, Markus Hartmann, Robert Brandt, Ralph Döhrmann, Giovanni Fevola, Christina Ossig, Michael Elias Stuckelberger, Jan Garrevoet, Ken Vidar Falch, Vanessa Galbierz, Gerald Falkenberg, Peter Modregger
Formato: Artigo
Idioma:English
Publicado em: International Union of Crystallography 2022-11-01
Colecção:Journal of Synchrotron Radiation
Assuntos:
x-ray diffraction
high spatial resolution
high photon energy
x-ray fluorescence
goniometers
Acesso em linha:http://scripts.iucr.org/cgi-bin/paper?S1600577522008025

Internet

http://scripts.iucr.org/cgi-bin/paper?S1600577522008025

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