Prediction of technological properties of wheat flour by combination of UV-VIS-NIR spectroscopy and multivariate analysis methods

Prediction of technological properties of wheat flour by combination of UV-VIS-NIR spectroscopy and multivariate analysis methods

Over the last decades, optical spectroscopy methods that do not require complex sample preparation have been widely used to identify and control the composition of food products. In the present study, the possibility of using UV-VIS-NIR spectroscopy combined with multivariate analysis for grading wh...

Szczegółowa specyfikacja

Opis bibliograficzny
Główni autorzy: R. A. Platova, E. V. Zhirkova, D. A. Metlenkin, A. A. Lysenkova, Yu. T. Platov, V. A. Rassulov
Format: Artykuł
Język:Russian
Wydane: Russian Academy of Sciences, V.M. Gorbatov Federal Research Center for Food Systems 2024-04-01
Seria:Пищевые системы
Hasła przedmiotowe:
wheat flour
technological properties of flour
color
colorimetric system l*a*b*
uv-vis-nir spectroscopy
principal component analysis
linear discriminant analysis
Dostęp online:https://www.fsjour.com/jour/article/view/399

Internet

https://www.fsjour.com/jour/article/view/399

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