Flexural Fatigue Test—A Proposed Method to Characterize the Lifetime of Conductor Tracks on Polymeric Substrates

Flexural Fatigue Test—A Proposed Method to Characterize the Lifetime of Conductor Tracks on Polymeric Substrates

High quality and long product life are two fundamental requirements for all circuit carriers, including molded interconnect devices (MID), to find application in various fields, such as automotive, sensor technology, medical technology, and communication technology. When developing a MID for a certa...

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Bibliographic Details
Main Authors: Simon Petillon, Andrea Knöller, Philipp Bräuer, David Helm, Tobias Grözinger, Sascha Weser, Wolfgang Eberhardt, Jörg Franke, André Zimmermann
Format: Article
Language:English
Published: MDPI AG 2022-04-01
Series:Journal of Manufacturing and Materials Processing
Subjects:
conductor track
flexural fatigue test
laser direct structuring
metallization
molded interconnect device
Online Access:https://www.mdpi.com/2504-4494/6/2/41

Internet

https://www.mdpi.com/2504-4494/6/2/41

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