Dynamic Error Recovery Flow Prediction Based on Reusable Machine Learning for Low Latency NAND Flash Memory Under Process Variation

Dynamic Error Recovery Flow Prediction Based on Reusable Machine Learning for Low Latency NAND Flash Memory Under Process Variation

NAND flash memory is becoming smaller and denser to have a larger storage capacity as technologies related to fine processes are developed. As a side effect of high-density integration, the memory can be vulnerable to circuit-level noise such as random telegraph noise, decreasing the reliability of...

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Bibliographic Details
Main Authors: Minyoung Hwang, Jeongju Jee, Joonhyuk Kang, Hyuncheol Park, Seonmin Lee, Jinyoung Kim
Format: Article
Language:English
Published: IEEE 2022-01-01
Series:IEEE Access
Subjects:
NAND flash memory system
process variation
error management
reusable machine learning
transfer learning
meta learning
Online Access:https://ieeexplore.ieee.org/document/9940942/

Internet

https://ieeexplore.ieee.org/document/9940942/

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