P2 random walk: self-supervised anomaly detection with pixel-point random walk
Abstract In the domain of intelligent manufacturing, automatic anomaly detection plays a pivotal role and holds great significance for improving production efficiency and product quality. However, the scarcity and uncertainty of anomalous data pose significant challenges in this field. Data augmenta...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Springer
2023-12-01
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| Series: | Complex & Intelligent Systems |
| Subjects: | |
| Online Access: | https://doi.org/10.1007/s40747-023-01285-z |