Sheet Resistance Measurements of Conductive Thin Films: A Comparison of Techniques

Sheet Resistance Measurements of Conductive Thin Films: A Comparison of Techniques

Conductive thin films are an essential component of many electronic devices. Measuring their conductivity accurately is necessary for quality control and process monitoring. We compare conductivity measurements on films for flexible electronics using three different techniques: four-point probe, mic...

Full description

Bibliographic Details
Main Authors: Mira Naftaly, Satyajit Das, John Gallop, Kewen Pan, Feras Alkhalil, Darshana Kariyapperuma, Sophie Constant, Catherine Ramsdale, Ling Hao
Format: Article
Language:English
Published: MDPI AG 2021-04-01
Series:Electronics
Subjects:
thin films
sheet resistance
four-point probe
microwave resonator
terahertz time-domain spectroscopy
Online Access:https://www.mdpi.com/2079-9292/10/8/960

Internet

https://www.mdpi.com/2079-9292/10/8/960

Similar Items