Sheet Resistance Measurements of Conductive Thin Films: A Comparison of Techniques
Conductive thin films are an essential component of many electronic devices. Measuring their conductivity accurately is necessary for quality control and process monitoring. We compare conductivity measurements on films for flexible electronics using three different techniques: four-point probe, mic...
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| Format: | Article |
| Language: | English |
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MDPI AG
2021-04-01
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| Series: | Electronics |
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| Online Access: | https://www.mdpi.com/2079-9292/10/8/960 |
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| author | Mira Naftaly Satyajit Das John Gallop Kewen Pan Feras Alkhalil Darshana Kariyapperuma Sophie Constant Catherine Ramsdale Ling Hao |
| author_facet | Mira Naftaly Satyajit Das John Gallop Kewen Pan Feras Alkhalil Darshana Kariyapperuma Sophie Constant Catherine Ramsdale Ling Hao |
| author_sort | Mira Naftaly |
| collection | DOAJ |
| description | Conductive thin films are an essential component of many electronic devices. Measuring their conductivity accurately is necessary for quality control and process monitoring. We compare conductivity measurements on films for flexible electronics using three different techniques: four-point probe, microwave resonator and terahertz time-domain spectroscopy. Multiple samples were examined, facilitating the comparison of the three techniques. Sheet resistance values at DC, microwave and terahertz frequencies were obtained and were found to be in close agreement. |
| first_indexed | 2024-03-10T12:14:24Z |
| format | Article |
| id | doaj.art-6284cd904748489a8d78128da096982f |
| institution | Directory Open Access Journal |
| issn | 2079-9292 |
| language | English |
| last_indexed | 2024-03-10T12:14:24Z |
| publishDate | 2021-04-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Electronics |
| spelling | doaj.art-6284cd904748489a8d78128da096982f2023-11-21T15:58:12ZengMDPI AGElectronics2079-92922021-04-0110896010.3390/electronics10080960Sheet Resistance Measurements of Conductive Thin Films: A Comparison of TechniquesMira Naftaly0Satyajit Das1John Gallop2Kewen Pan3Feras Alkhalil4Darshana Kariyapperuma5Sophie Constant6Catherine Ramsdale7Ling Hao8National Physical Laboratory, Teddington TW11 0LW, UKPragmatIC Semiconductor Limited, Cambridge CB4 0WH, UKNational Physical Laboratory, Teddington TW11 0LW, UKNational Physical Laboratory, Teddington TW11 0LW, UKPragmatIC Semiconductor Limited, Cambridge CB4 0WH, UKPragmatIC Semiconductor Limited, Cambridge CB4 0WH, UKNational Physical Laboratory, Teddington TW11 0LW, UKPragmatIC Semiconductor Limited, Cambridge CB4 0WH, UKNational Physical Laboratory, Teddington TW11 0LW, UKConductive thin films are an essential component of many electronic devices. Measuring their conductivity accurately is necessary for quality control and process monitoring. We compare conductivity measurements on films for flexible electronics using three different techniques: four-point probe, microwave resonator and terahertz time-domain spectroscopy. Multiple samples were examined, facilitating the comparison of the three techniques. Sheet resistance values at DC, microwave and terahertz frequencies were obtained and were found to be in close agreement.https://www.mdpi.com/2079-9292/10/8/960thin filmssheet resistancefour-point probemicrowave resonatorterahertz time-domain spectroscopy |
| spellingShingle | Mira Naftaly Satyajit Das John Gallop Kewen Pan Feras Alkhalil Darshana Kariyapperuma Sophie Constant Catherine Ramsdale Ling Hao Sheet Resistance Measurements of Conductive Thin Films: A Comparison of Techniques Electronics thin films sheet resistance four-point probe microwave resonator terahertz time-domain spectroscopy |
| title | Sheet Resistance Measurements of Conductive Thin Films: A Comparison of Techniques |
| title_full | Sheet Resistance Measurements of Conductive Thin Films: A Comparison of Techniques |
| title_fullStr | Sheet Resistance Measurements of Conductive Thin Films: A Comparison of Techniques |
| title_full_unstemmed | Sheet Resistance Measurements of Conductive Thin Films: A Comparison of Techniques |
| title_short | Sheet Resistance Measurements of Conductive Thin Films: A Comparison of Techniques |
| title_sort | sheet resistance measurements of conductive thin films a comparison of techniques |
| topic | thin films sheet resistance four-point probe microwave resonator terahertz time-domain spectroscopy |
| url | https://www.mdpi.com/2079-9292/10/8/960 |
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