Sheet Resistance Measurements of Conductive Thin Films: A Comparison of Techniques
Conductive thin films are an essential component of many electronic devices. Measuring their conductivity accurately is necessary for quality control and process monitoring. We compare conductivity measurements on films for flexible electronics using three different techniques: four-point probe, mic...
Main Authors: | Mira Naftaly, Satyajit Das, John Gallop, Kewen Pan, Feras Alkhalil, Darshana Kariyapperuma, Sophie Constant, Catherine Ramsdale, Ling Hao |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2021-04-01
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Series: | Electronics |
Subjects: | |
Online Access: | https://www.mdpi.com/2079-9292/10/8/960 |
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