Study of Some Properties of PbI2 Deposited on Porous Silicon Using Thermal Evaporation Technique for Many Applications
The present work is a study of some properties of PbI<sub>2</sub> deposited on porous silicon (n-PSi) by using the thermal evaporation technique. X-ray diffraction, scanning electron microscopy, UV–Vis spectrophotometer, and FTIR analysis were used to characterize the structural, optical...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
University of Technology, Baghdad
2022-09-01
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| Series: | Journal of Applied Sciences and Nanotechnology |
| Subjects: | |
| Online Access: | https://jasn.uotechnology.edu.iq/article_19437_f4c3b1b54ca0e0c568e546618fd12c1c.pdf |