Study of Some Properties of PbI2 Deposited on Porous Silicon Using Thermal Evaporation Technique for Many Applications

Study of Some Properties of PbI2 Deposited on Porous Silicon Using Thermal Evaporation Technique for Many Applications

The present work is a study of some properties of PbI<sub>2</sub> deposited on porous silicon (n-PSi) by using the thermal evaporation technique. X-ray diffraction, scanning electron microscopy, UV–Vis spectrophotometer, and FTIR analysis were used to characterize the structural, optical...

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Bibliographic Details
Main Authors: Suha Ali, Mohammed Mohammed, Fatima Sultan
Format: Article
Language:English
Published: University of Technology, Baghdad 2022-09-01
Series:Journal of Applied Sciences and Nanotechnology
Subjects:
lead iodide
porous silicon
thermal evaporation
x-ray diffraction
Online Access:https://jasn.uotechnology.edu.iq/article_19437_f4c3b1b54ca0e0c568e546618fd12c1c.pdf

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