Molecular Genetic Diversity and Line × Tester Analysis for Resistance to Late Wilt Disease and Grain Yield in Maize

Molecular Genetic Diversity and Line × Tester Analysis for Resistance to Late Wilt Disease and Grain Yield in Maize

Late wilt disease (LWD) caused by the fungus <i>Magnaporthiopsis maydis</i> poses a major threat to maize production. Developing high-yielding and resistant hybrids is vital to cope with this destructive disease. The present study aimed at assessing general (GCA) and specific (SCA) combi...

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Bibliographic Details
Main Authors: Mohamed M. Kamara, Nasr A. Ghazy, Elsayed Mansour, Mohsen M. Elsharkawy, Ahmed M. S. Kheir, Khaled M. Ibrahim
Format: Article
Language:English
Published: MDPI AG 2021-05-01
Series:Agronomy
Subjects:
<i>Magnaporthiopsis maydis</i>
<i>Zea mays</i>
high-yielding hybrids
SSR markers
combining ability
Online Access:https://www.mdpi.com/2073-4395/11/5/898

Internet

https://www.mdpi.com/2073-4395/11/5/898

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