Mixed-state electron ptychography enables sub-angstrom resolution imaging with picometer precision at low dose

With conventional scanning transmission electron microscopy, some sensitive materials are difficult to image with atomic resolution. The authors present a method of mixed-state electron ptychography that enables picometer precision with fast acquisition and low dosage.

Bibliographic Details
Main Authors: Zhen Chen, Michal Odstrcil, Yi Jiang, Yimo Han, Ming-Hui Chiu, Lain-Jong Li, David A. Muller
Format: Article
Language:English
Published: Nature Portfolio 2020-06-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-020-16688-6