Effect of common branch impedance coupling and mutual inductance on current sharing of paralleled SiC MOSFETs with different layouts
Abstract Overcurrent failure caused by imbalanced current distribution is one of the universal failure forms of the SiC MOSFET module. The current sharing of parallel SiC MOSFETs is an important guarantee for the safe and reliable operation of parallel devices even the whole system. The existence of...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2022-01-01
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| Series: | IET Power Electronics |
| Subjects: | |
| Online Access: | https://doi.org/10.1049/pel2.12211 |