Low-Frequency Noise Characteristics in HfO<sub>2</sub>-Based Metal-Ferroelectric-Metal Capacitors

The transport mechanism of HfO<sub>2</sub>-based metal-ferroelectric-metal (MFM) capacitors was investigated using low-frequency noise (LFN) measurements for the first time. The current–voltage measurement results revealed that the leakage behavior of the fabricated MFM capacitor was cau...

Full description

Bibliographic Details
Main Authors: Ki-Sik Im, Seungheon Shin, Chan-Hee Jang, Ho-Young Cha
Format: Article
Language:English
Published: MDPI AG 2022-10-01
Series:Materials
Subjects:
Online Access:https://www.mdpi.com/1996-1944/15/21/7475