Fluxgate Sensor with Bifactor Excitation Mode

The paper considers non-destructive testing (NTDs) as a means to solve the flaw detection problems of magnetic products. It proposes a new probe-coil magnetic-field NDT, not requiring the pre-magnetization of the test object material, which is mandatory for all conventional magnetic flaw detection t...

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Bibliographic Details
Main Authors: Ivan V. Bryakin, Igor V. Bochkarev, Vadim R. Khramshin, Vadim R. Gasiyarov
Format: Article
Language:English
Published: MDPI AG 2023-02-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/23/4/1775