Resolving surface potential variation in Ge/MoS2 heterostructures with Kelvin probe force microscopy

Resolving surface potential variation in Ge/MoS2 heterostructures with Kelvin probe force microscopy

In this work, we employ an atomic force microscopy-based technique, Kelvin probe force microscopy, to analyze heterogeneities of four different 2D/3D Ge/MoS2 heterostructures with Ge chemical vapor deposition (CVD) time. High-contrast spatially resolved contact potential difference (CPD) maps reveal...

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Bibliographic Details
Main Authors: Sanguk Woo, Jinkyoung Yoo, David J. Magginetti, Ismail Bilgin, Swastik Kar, Heayoung P. Yoon, Yohan Yoon
Format: Article
Language:English
Published: AIP Publishing LLC 2021-12-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/5.0075599

Internet

http://dx.doi.org/10.1063/5.0075599

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