Resolving surface potential variation in Ge/MoS2 heterostructures with Kelvin probe force microscopy
In this work, we employ an atomic force microscopy-based technique, Kelvin probe force microscopy, to analyze heterogeneities of four different 2D/3D Ge/MoS2 heterostructures with Ge chemical vapor deposition (CVD) time. High-contrast spatially resolved contact potential difference (CPD) maps reveal...
| Main Authors: | , , , , , , |
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| Formato: | Artigo |
| Idioma: | English |
| Publicado em: |
AIP Publishing LLC
2021-12-01
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| Colecção: | AIP Advances |
| Acesso em linha: | http://dx.doi.org/10.1063/5.0075599 |