Automatic Semiconductor Wafer Image Segmentation for Defect Detection Using Multilevel Thresholding
Quality control is one of important process in semiconductor manufacturing. A lot of issues trying to be solved in semiconductor manufacturing industry regarding the rate of production with respect to time. In most semiconductor assemblies, a lot of wafers from various processes in semiconductor waf...
| Автори: | , , , |
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| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
EDP Sciences
2016-01-01
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| Серія: | MATEC Web of Conferences |
| Онлайн доступ: | http://dx.doi.org/10.1051/matecconf/20167801103 |