A Survey of Defect Detection Applications Based on Generative Adversarial Networks

A Survey of Defect Detection Applications Based on Generative Adversarial Networks

With the development of science and technology and the progress of the times, automation and intelligence have been popularized in manufacturing in all walks of life. With the progress of productivity, product defect detection has become an indispensable part. However, in practical scenarios, the ap...

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Bibliographic Details
Main Authors: Xiangjie He, Zhengwei Chang, Linghao Zhang, Houdong Xu, Hongbo Chen, Zhongqiang Luo
Format: Article
Language:English
Published: IEEE 2022-01-01
Series:IEEE Access
Subjects:
Deep learning
generating adversarial networks
defect detection
adversarial learning
Online Access:https://ieeexplore.ieee.org/document/9930483/

Internet

https://ieeexplore.ieee.org/document/9930483/

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