XPS chemical state mapping in opto- and microelectronics
The strength of XPS imaging lies in its ability to (i) locate small patterns on sample surface, and (ii) inform, with micrometric lateral resolution, about the chemical environment of the elements detected at the surface. In this context, strontium-based perovskites appear to be well-adapted for suc...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2022-01-01
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| Series: | EPJ Web of Conferences |
| Online Access: | https://www.epj-conferences.org/articles/epjconf/pdf/2022/17/epjconf_jnspe2022_01012.pdf |