Learning flat optics for extended depth of field microscopy imaging
Conventional microscopy systems have limited depth of field, which often necessitates depth scanning techniques hindered by light scattering. Various techniques have been developed to address this challenge, but they have limited extended depth of field (EDOF) capabilities. To overcome this challeng...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
De Gruyter
2023-08-01
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| Series: | Nanophotonics |
| Subjects: | |
| Online Access: | https://doi.org/10.1515/nanoph-2023-0321 |