Learning flat optics for extended depth of field microscopy imaging
Conventional microscopy systems have limited depth of field, which often necessitates depth scanning techniques hindered by light scattering. Various techniques have been developed to address this challenge, but they have limited extended depth of field (EDOF) capabilities. To overcome this challeng...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
De Gruyter
2023-08-01
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| Series: | Nanophotonics |
| Subjects: | |
| Online Access: | https://doi.org/10.1515/nanoph-2023-0321 |
| _version_ | 1797682329796214784 |
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| author | Atalay Appak Ipek Anil Sahin Erdem Guillemot Christine Caglayan Humeyra |
| author_facet | Atalay Appak Ipek Anil Sahin Erdem Guillemot Christine Caglayan Humeyra |
| author_sort | Atalay Appak Ipek Anil |
| collection | DOAJ |
| description | Conventional microscopy systems have limited depth of field, which often necessitates depth scanning techniques hindered by light scattering. Various techniques have been developed to address this challenge, but they have limited extended depth of field (EDOF) capabilities. To overcome this challenge, this study proposes an end-to-end optimization framework for building a computational EDOF microscope that combines a 4f microscopy optical setup incorporating learned optics at the Fourier plane and a post-processing deblurring neural network. Utilizing the end-to-end differentiable model, we present a systematic design methodology for computational EDOF microscopy based on the specific visualization requirements of the sample under examination. In particular, we demonstrate that the metasurface optics provides key advantages for extreme EDOF imaging conditions, where the extended DOF range is well beyond what is demonstrated in state of the art, achieving superior EDOF performance. |
| first_indexed | 2024-03-11T23:59:09Z |
| format | Article |
| id | doaj.art-670d1295b5af4dafb45a30f96b8a1f6d |
| institution | Directory Open Access Journal |
| issn | 2192-8614 |
| language | English |
| last_indexed | 2024-03-11T23:59:09Z |
| publishDate | 2023-08-01 |
| publisher | De Gruyter |
| record_format | Article |
| series | Nanophotonics |
| spelling | doaj.art-670d1295b5af4dafb45a30f96b8a1f6d2023-09-18T06:32:06ZengDe GruyterNanophotonics2192-86142023-08-0112183623363210.1515/nanoph-2023-0321Learning flat optics for extended depth of field microscopy imagingAtalay Appak Ipek Anil0Sahin Erdem1Guillemot Christine2Caglayan Humeyra3Faculty of Engineering and Natural Science, Photonics, Tampere University, 33720Tampere, FinlandFaculty of Information Technology and Communication Sciences, Tampere University, 33720Tampere, FinlandINRIA Rennes – Bretagne Atlantique, Rennes, FranceFaculty of Engineering and Natural Science, Photonics, Tampere University, 33720Tampere, FinlandConventional microscopy systems have limited depth of field, which often necessitates depth scanning techniques hindered by light scattering. Various techniques have been developed to address this challenge, but they have limited extended depth of field (EDOF) capabilities. To overcome this challenge, this study proposes an end-to-end optimization framework for building a computational EDOF microscope that combines a 4f microscopy optical setup incorporating learned optics at the Fourier plane and a post-processing deblurring neural network. Utilizing the end-to-end differentiable model, we present a systematic design methodology for computational EDOF microscopy based on the specific visualization requirements of the sample under examination. In particular, we demonstrate that the metasurface optics provides key advantages for extreme EDOF imaging conditions, where the extended DOF range is well beyond what is demonstrated in state of the art, achieving superior EDOF performance.https://doi.org/10.1515/nanoph-2023-0321diffractive opticsend-to-end learningextended depth of fieldmetasurfacesmicroscopy imaging |
| spellingShingle | Atalay Appak Ipek Anil Sahin Erdem Guillemot Christine Caglayan Humeyra Learning flat optics for extended depth of field microscopy imaging Nanophotonics diffractive optics end-to-end learning extended depth of field metasurfaces microscopy imaging |
| title | Learning flat optics for extended depth of field microscopy imaging |
| title_full | Learning flat optics for extended depth of field microscopy imaging |
| title_fullStr | Learning flat optics for extended depth of field microscopy imaging |
| title_full_unstemmed | Learning flat optics for extended depth of field microscopy imaging |
| title_short | Learning flat optics for extended depth of field microscopy imaging |
| title_sort | learning flat optics for extended depth of field microscopy imaging |
| topic | diffractive optics end-to-end learning extended depth of field metasurfaces microscopy imaging |
| url | https://doi.org/10.1515/nanoph-2023-0321 |
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