Linked Coupling Faults Detection by Multirun March Tests
This paper addresses the problem of describing the complex linked coupling faults of memory devices and formulating the necessary and sufficient conditions for their detection. The main contribution of the proposed approach is based on using a new formal model of such faults, the critical element of...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2024-03-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/14/6/2501 |