Negative Ion Beam Focusing in a Plasma Sputter-type Negative Ion Source

The ion beam produced from a plasma sputter-type negative ion source with Zr target was analyzed, and the negative ion beam current was increased by focusing with an electrostatic Einzel lens. An Ar-N2 plasma at 7.0x 10-3 Torr (20%N2) with discharge current voltage=-20 V and discharge current=1.0 A...

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Main Authors: Miguel Yambot, Alexander Mendenilla, Nico Valmoria, Henry Ramos, Alipio Garcia
Format: Article
Language:English
Published: University of the Philippines 1999-12-01
Series:Science Diliman
Subjects:
Online Access:http://journals.upd.edu.ph/index.php/sciencediliman/article/view/243
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author Miguel Yambot
Alexander Mendenilla
Nico Valmoria
Henry Ramos
Alipio Garcia
author_facet Miguel Yambot
Alexander Mendenilla
Nico Valmoria
Henry Ramos
Alipio Garcia
author_sort Miguel Yambot
collection DOAJ
description The ion beam produced from a plasma sputter-type negative ion source with Zr target was analyzed, and the negative ion beam current was increased by focusing with an electrostatic Einzel lens. An Ar-N2 plasma at 7.0x 10-3 Torr (20%N2) with discharge current voltage=-20 V and discharge current=1.0 A was produced for sputter formation of negative ions in the ion source. The Zr target immersed in the plasma was biased at -200 V. The ion beam was analyzed with a retarding potential electrostatic energy analyzer. Lens potentials of 20.0 V for the outer electrodes and -80.3 V for the inner electrode resulted in the highest negative ion beam current, increasing the ion current to 0.5 nA (from 0.28 nA when not using the lens), and reduced the beam spot size to 25 mm (from 35 mm for the unfocused beam).
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spelling doaj.art-67afb376f4594b98b6aae589825710a12022-12-21T22:23:31ZengUniversity of the PhilippinesScience Diliman0115-78092012-08181999-12-011124446Negative Ion Beam Focusing in a Plasma Sputter-type Negative Ion SourceMiguel YambotAlexander MendenillaNico ValmoriaHenry RamosAlipio GarciaThe ion beam produced from a plasma sputter-type negative ion source with Zr target was analyzed, and the negative ion beam current was increased by focusing with an electrostatic Einzel lens. An Ar-N2 plasma at 7.0x 10-3 Torr (20%N2) with discharge current voltage=-20 V and discharge current=1.0 A was produced for sputter formation of negative ions in the ion source. The Zr target immersed in the plasma was biased at -200 V. The ion beam was analyzed with a retarding potential electrostatic energy analyzer. Lens potentials of 20.0 V for the outer electrodes and -80.3 V for the inner electrode resulted in the highest negative ion beam current, increasing the ion current to 0.5 nA (from 0.28 nA when not using the lens), and reduced the beam spot size to 25 mm (from 35 mm for the unfocused beam).http://journals.upd.edu.ph/index.php/sciencediliman/article/view/243negative ion sourceelectrostatic einzel lens
spellingShingle Miguel Yambot
Alexander Mendenilla
Nico Valmoria
Henry Ramos
Alipio Garcia
Negative Ion Beam Focusing in a Plasma Sputter-type Negative Ion Source
Science Diliman
negative ion source
electrostatic einzel lens
title Negative Ion Beam Focusing in a Plasma Sputter-type Negative Ion Source
title_full Negative Ion Beam Focusing in a Plasma Sputter-type Negative Ion Source
title_fullStr Negative Ion Beam Focusing in a Plasma Sputter-type Negative Ion Source
title_full_unstemmed Negative Ion Beam Focusing in a Plasma Sputter-type Negative Ion Source
title_short Negative Ion Beam Focusing in a Plasma Sputter-type Negative Ion Source
title_sort negative ion beam focusing in a plasma sputter type negative ion source
topic negative ion source
electrostatic einzel lens
url http://journals.upd.edu.ph/index.php/sciencediliman/article/view/243
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AT henryramos negativeionbeamfocusinginaplasmasputtertypenegativeionsource
AT alipiogarcia negativeionbeamfocusinginaplasmasputtertypenegativeionsource